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Chena804 Group Title

As part of the yield-improvement effort at a semicon­ductor-manufacturing facility, a patterned wafer inspection system was used to provide defect data for a sample of 450 wafers. The results were cross-classified according to two characteristics: "Was a particle found on the die that produced the wafer?", and "Is the wafer good or bad?" Quality of Wafer No Particles Particles Total Good 320 14 334 Bad 80 36 116 Total 400 50 450 (a) Give an example of a simple event. (b) Give an example of a joint event. (c) What is the complement of the event a good wafer? (d) Why is a g

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  1. AravindG Group Title
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    pretty big qn

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